Component

unbekannt CTX125 X-RAY System Kontrolleinheit

Year of construction: 2025, condition: new, X-ray inspection system for middle-sized bags, packs. Suitable for detecting foreign objects made of metal, glass, stone, plastic, etc. in food or non-food items. - Specifications: conveyor belt width: 410 mm; detection accuracy: Pb from Ø 0.2 mm, Fe from Ø 0.28 mm, SUS from Ø 0.28 mm, non-metallic such as stone, glass, from Ø 1.2 mm; X-ray output: 80 kVp, 1.25 mA; X-ray detector resolution: 0.4 mm; X-ray emissions: < 1usv/h; conveyor belt height: 850 ± 30 mm; conveyor speed (dependent on product dimensions): 10 – 100 m/min; screen: 15" touch screen; software: intellisens®X-ray; operating temperature: 5 – 35 °C; reject system: optionally available according to requirements; power: 220VAC, 50/60Hz; dimensions of the system L900xW920xH1825 mm; weight: 350 kg. Iodpjv Nm Inofx Adrjbf Please note that our new prices are often below the usual used prices. Please feel free to inquire and tell us your packaging task. - Usually 30-50 different new machines are available immediately from stock. In addition, we have very short delivery times from approx. 3 weeks for customized machines. Deviations from the sample photo are possible. - All machines are available with full warranty.

Condition: defective spare-parts repository (used), Oxford Instruments X-Strata 960 X-ray Fluorescence Analyzer – For Parts / Defective Item Description: For sale is a used X-ray fluorescence analyzer, model Oxford Instruments X-Strata 960. This device was removed during a laboratory decommission and is being offered exclusively for parts or potential repair. No functionality test has been carried out – the unit is therefore considered defective for the purposes of this sale. Technical Data – Oxford Instruments X-Strata 960 (non-binding) Feature Description Model: X-Strata 960 Manufacturer: Oxford Instruments Analysis Method: X-ray fluorescence analysis (XRF) Applications: Coating thickness measurement, material analysis, precious metal testing Measurement Geometry: Top-down or bottom-up, depending on configuration Radiation Source: X-ray tube (e.g., rhodium anode), 50–100 W output Detector: Proportional counter or silicon drift detector (SDD), depending on version Iedehaapfspfx Adrjbf Measurement Range: Coating thickness approx. 0.005 – 50 µm (material-dependent) Spot Size: Approx. 15 μm – 1 mm (depending on collimator) Z-axis: Motorized travel, up to approx. 230 mm measurement height Sample Chamber (W × D × H): Approx. 580 × 510 × 230 mm Sample Table: Manual or motorized (200 × 200 mm or larger, depending on configuration) Focusing System: Optical / laser focus, semi-automatic Operating System: Integrated industrial PC with Windows-based evaluation software Power Supply: 220–240 V / 50–60 Hz / approx. 500–800 W Unit Weight: Approx. 150–200 kg (depending on version) Condition: Used / Defective / For parts Scope of Delivery: As shown in the images – without accessories or software Important Notes: - Sale expressly as a defective device with no guarantee of functionality. - The item is offered for parts or for repair enthusiasts. - No warranty as to function, completeness, or technical specifications. - Commercial sale excluding any liability for defects, in accordance with § 447 BGB (Shipping Purchase). Scope of Delivery: - Oxford Instruments X-Strata 960 - All components visible in the images - No further parts, accessories or documentation included unless explicitly listed. Shipping & Collection: - Collection is possible and preferred in Borken - Shipping available upon arrangement. (Technical data subject to change and errors excepted!) We are happy to answer further questions by phone.

Year of construction: 2016, condition: excellent (used), Automatic X-ray inspection For the inspection of BGA, QFN, THT, LED, LGA, and other solder joints, visible or hidden. Other: Including offline station and repair station OS: Windows 7 Ultra-high speed line-scan CCD detectors Inspection area: 450 mm - 400 mm Image capture: 2D, 2.5D, 3D (layer images with planar CT) PCB dimensions: 60 - 450 x 50 - 400 mm AXI resolution: 6 - 30 µm / px AOI: Camera field of view: 42 mm x 42 mm Resolution: 21 µm Inspection height: -3 to 7.5 mm Optics: telecentric Transport height: 950 mm +/- 25 mm Interface: SMEMA Width adjustment: automatic Ibodpowpuadefx Adref

Year of construction: 2016, condition: ready for operation (used), An almost new Anritsu X-ray inspection system is available. X-ray power: 100W, max. detection width: 240mm, max. detection height: 120mm, detection speed from 2kg to 5kg: 10m-60m/min, detection speed up to 2kg: 60m-90m/min, detection speed from 5kg to 10kg: 10m-40m/min, housing material: stainless steel, machine weight: approx. 255kg, operating hours: less than 50h. The machine shows no wear on the conveyor belt or the radiation protection curtains. Documentation available. On-site inspection is possible. Ibodevzr Auepfx Adrof

Condition: used, PANalytical PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD) Excerpt from the service report: Device: PANalytical X’Pert PRO MPD Report date: 07.07.2021 Work performed: Ibedpfx Adswycaterjf - Reinstallation and commissioning of the system - Connection of external supply lines - Warm-up phase - Complete alignment of goniometer and additional components - Maintenance carried out, including replacement of defective parts Spare parts used: L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD FAN FOR X-CELERATOR UNIT FILTER, WATER Motor PW3050 ("Device was not tested in-house") The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials. It is ideal for pure research as well as routine applications in industry and academia. Thanks to its modular design, fast detection, and control of temperature and atmosphere, it is excellently suited for both routine analyses and complex in-situ experiments. Key features: - Multiple measurement geometries possible: - Reflection measurements in Bragg-Brentano (θ–2θ) mode - Transmission geometry for powders in capillaries - Optional SAXS (Small-Angle X-ray Scattering) for nanostructure analysis - Radiation source and detectors: - Typically copper anode (Cu-Kα, λ ≈ 1.54 Å) - X’Celerator detector (1D, ultra-fast) for parallel data acquisition - Modular system with PreFIX technology: - Rapid change of optics and sample stages without recalibration - In-situ measurements at high temperatures: - Measurements up to approx. 1200°C possible - Controlled atmosphere: air, nitrogen, oxygen (limited for reducing atmospheres) Typical applications: - Phase analysis and quantitative Rietveld refinement - Determination of crystallite size, microstrain, residual stress - In-situ investigation of phase transitions, oxidation, crystallization, etc. - SAXS measurements for analysis of nanoparticles and pore structures - Broad range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more Technical data (typical) Property & Specification Angle range (2θ): approx. 0.5° to 150° Step size: up to 0.002° or finer Goniometer: vertical, 0–0, radius approx. 240 mm Temperature range: room temperature up to approx. 1200°C Atmosphere: air, N₂, O₂ (limited for reducing atmospheres) Detectors: X’Celerator (1D), proportional counter Distribution & application areas: The X’Pert PRO MPD is in use worldwide at, for example: - Universities (ETH Zurich, TU Dresden, University of Vienna) - Research institutes (e.g., Max Planck Institutes, ICN2, IS2M) - Industry (e.g., materials development, pharmaceuticals, chemistry) Condition: used Scope of delivery: (See image) (Specifications and technical data subject to change and error!) For further questions, we are happy to assist you by phone.

Condition: good (used), Helmut Fischer Fischerscope X-ray fluorescence coating thickness measurement XDL-XYmZ Ibodow Hbkdopfx Adrsf