Used Scanning Electron Microscope Zeiss Xb350 for sale (8,545)

Condition: like new (used), Year of construction: 2024, functionality: fully functional, Scanning Electron Microscope (SEM) Zeiss XB 350 Cjdpfjw Rdvvex Ailsgw Configuration and Accessories • Without FIB Column • SmartSEM- and SmartFIB-Software • GIS with Pt Precursor • Integrated Plasma Cleaner • EDS Oxford Xplore 30 (incl. Interface & Software) • Automatically 200 mm Air Lock • Electrical Feed-Through (2 x 15 Channels) • Circulation Cooling • Vacuum Buffer Tank (Quiet Mode) • ... and Table, Screen, Control Panel (i.e. Unique Zeiss Keyboard + Joystick) and Misc. Probe Holders Launch: August 2024 Site: Germany, Mainz Available at short notice by arrangement. The SEM is still in operation and can be viewed and demonstrated. The device has no defects or quirks and is fully functional. Further information available on request!

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition Cjdpszd Ufajfx Ailegw – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is a device equipped with an integrated 4 MB image memory, a 40 MB hard drive for internal image storage, as well as drives for external storage of data and images. This allows for quick and easy acquisition of information about the composition and morphology of specimen surfaces, even down to the sub-micrometer range. With a magnification range of 5x to 300,000x, both the examination of macrostructures and microstructures is possible. Through special attachments, the range of applications can be significantly expanded, enabling, for example, analytical investigations in micro-areas of the surface. The device can be operated using conventional switches or via the keyboard and mouse (optional). The electron optics and vacuum control are conventional. The functions of the image memory are operated using the keyboard or mouse (optional). A separate information display is located centrally on the control panel for displaying the menus. This user manual is intended to serve as a guide for the user to achieve the best possible results with the device. The explanations have been kept as simple as possible in order to provide even a less experienced user with the necessary knowledge. Magnification range: 20x to 300,000x at a 7 mm working distance Steps in a sequence of 1-2-3-5-10 Minimum magnification: 5x at a 50 mm working distance Resolution: 4 nm - guaranteed with tungsten filament at 30 kV, 6 mm working distance, untilted specimen 25 nm - guaranteed with tungsten filament at 1 kV, 6 mm working distance, untilted specimen 3.5 nm - guaranteed with optimized LaB6 filament at 30 kV, 6 mm working distance, untilted specimen Scope of supply: (DSM 962 with accessories as shown) Codpfx Aiezdthyjlegw Condition: used (Changes and errors in the technical data are subject to change!) Please inquire about transport options before purchasing. We will be happy to answer any further questions you may have by phone.

Year of construction: 2022, condition: as good as new (ex-display), functionality: fully functional, Description (detailed configuration): o 5-axis stage o Modern, expandable user interface with EDX integration and image composition o SE detector o Scintillator BSE detector (retractable) o In-Lens detector o Low vacuum system with BSE detector (retractable) o Fully software-integrated JEOL-EDX system (60mm²) Csdpfexzqw Tox Ailsgw o In-column current measurement o Navigation camera o Live camera o Control console o Desk, PC with Windows OS, 2 x 24" monitors, keyboard

Year of construction: 2024, condition: as good as new (ex-display), functionality: fully functional, The JCM-7000 combines simple sample navigation with a range of advanced automatic functions. A large sample chamber, high resolution, and an optional low vacuum mode for non-conductive samples make this desktop SEM a versatile, mobile all-rounder. Features: • SE/BSE detection • Magnification up to x100,000, resolution approx. 8 nm • Low vacuum operation for non-conductive samples • Hardware and software integrated EDX system for elemental characterization • Live elemental analysis, live imaging (including 3D imaging/topography) • Intuitive operation with recipes, automatic functions, image montages, etc. Csdpfxoxzqr Dj Ailegw • Large chamber for samples up to 80 mm diameter and 50 mm height • Compact & mobile • Dimensions (Main Unit): 324 mm W x 586 mm D x 566 mm H

Condition: good (used), Zeiss Primovert Inverted Microscope (Serial Number: 3841010097) WF 10x/20 eyepieces Zeiss Primo Plan-Achromat 4x/0.10 objective Codpezhidrjfx Ailegw Zeiss Primo Plan-Achromat 10x/0.25 Ph1 objective Zeiss Primo Plan-Achromat 20x/0.30 Ph1 objective Zeiss Primo Plan-Achromat 40x/0.50 Ph1 objective Ph1 / 0.3 phase slider Dust cover

Condition: used, Year of construction: 2014, functionality: fully functional, Equipment: Laser microscope Control computer (Windows 7) Objective lens CF Plan 10x / 0.30 NA Objective lens CF Plan 20x / 0.46 NA Objective lens CF Plan ELWD 50x / 0.65 NA Objective lens CF Plan Apo 150x / 0.95 NA Suitable for general high-resolution 3D visualization, roughness measurement (profiles and surfaces), step analysis, 2D dimensions, etc. High degree of automation in the evaluation process through an Excel-based "VK Viewer". Inspection possible in 66540 Neunkirchen. Pickup only. I am happy to provide a four-hour training session upon pickup. The software is quite intuitive. Codpfjzh I R Dsx Ailsgw Private sale. VAT not shown.

Condition: used, functionality: unexamined, machine/vehicle number: SX-50, Used Cameca SX-50 Electron Microprobe Codpfx Aijwnb D Tslogw Cameca SX-50 electron microprobe is used (Electron Probe MicroAlalyses). it has a 6” inch stage, 3 WDX Spectrometers with several Cristals LiF, PET, TAP, ODPb, PC1, PC2, PC3. Electron probe microanalysis (EPMA) are generally considered micro-analytical techniques which are able to image or analyze materials we can not generally observe with the resolution offered by visible techniques System is complete with all Books, service Manuals, Software and computer. Also many parts. 1 x Leybold Trivac D16B Vacuum Pump 1 x Alcatel 2012 A Vacuum Pump 2 x integrated Turbo Pumps

Condition: used, This listing is for 1 of 2 Zeiss Standard 20 Microscope Cjdpfjxzh Tfex Ailsgw

Condition: used, This listing is for a Zeiss Stemi DV4 Microscope Cedpfx Aoxzh T Sjilsgw

Condition: used, This listing is for a Zeiss Axioskop EL-Einsatz 5 Objectives Microscope. The unit is in full working condition and is ready for immediate release. Objective Lenses supplied: Plan 100/1.25 Plan 40X/0.66 Plan 20x/0.40 Achroplan 10x/0.25 SPL10/0.25 Zeiss Axioskop EL-Einsatz 5 Microscope Overview The Zeiss Axioskop EL-Einsatz 5 microscope is a sophisticated instrument designed for advanced microscopy tasks, particularly in research and clinical settings. Its range of objective lenses and features supports high-quality imaging and user-friendly operation. Key Features: Water Immersion: These objective lenses are designed for application in physiological salt solutions, making them perfect for examining thick biological specimens, such as brain sections. High Numerical Aperture (NA): The lenses feature high NA values (e.g., 0.80 for the 50x lens), enhancing light-gathering capability and image resolution, especially beneficial for fluorescence microscopy. Fluorescence Capabilities: The Axioskop EL-Einsatz 5 can capture fluorescent images across four channels. The system automatically adjusts brightness and white balance, simplifying the imaging process. Ergonomic Design: With an adjustable ergotube, users can comfortably position the eyepieces for extended use. Essential controls are conveniently located for ease of access. Smart Microscopy: The microscope is built for efficiency, featuring automatic adjustments that minimize the need for manual intervention, streamlining workflow. Applications: The Zeiss Axioskop EL-Einsatz 5 is suitable for a variety of applications, including: Materials Science and Metallography: Ideal for examining the microstructure of materials and conducting failure analysis. Physiology and Electrophysiology: Csdpfxsxxzlie Ailjgw Great for observing living cells and tissues, understanding physiological processes in real-time. Biomedical Research and Clinical Diagnostics: Useful for analysing biological samples, including histological sections and cultured cells, contributing to disease research and diagnostics. Microscopy Tasks Requiring Advanced Imaging Capabilities: Perfect for researchers needing high-resolution images and automation in their microscopy tasks.

Condition: used, This listing is for a Zeiss Standard 15 Microscope Objectives F2,5/0,08 F10.25 Cgsdpfx Aisxzg Tqjlsw F40/0,65

Condition: used, This listing is for a Zeiss Axioskop Microscope Cgsdpfxsxzh Trs Ailew No Abjectives included

Condition: excellent (used), Year of construction: 2019, functionality: fully functional, measuring range X-axis: 1,000 mm, measuring range Y-axis: 1,000 mm, measuring range Z-axis: 1,000 mm, ZEISS Comet®LƎD 8M 3D scanner, software + computer Cgedsy Sg N Ajpfx Ailow

Condition: excellent (used), Zeiss Coordinate Measuring Machine Model: O-INSPECT 442 Machine Designation: Coordinate Measuring Machine Machine Type: O-INSPECT 442 The multisensor measuring machine O-INSPECT ZEISS enables optimal optical or contact measurement of all features. The CALYPSO software simultaneously displays the actual state, nominal profile, and deviations, making measurement results easy to identify and interpret. General Data: Dimensions: Width 1055 mm, Length 1351 mm, Height 1770 mm Measuring range: X 400 mm, Y 400 mm, Z 200 mm Weight: CMM 800 kg Workpiece, max. 20 kg CMM noise level < 70 dBA Electrical Data: Supply voltage: 100, 110, 120, 125, 230, 240 V~ (± 10 %) Current type: 1 / N / PE Frequency: 50 to 60 Hz (± 3.5 %) Power consumption: max. 1500 VA Fuses: At 230 V or 240 V: 16 A At 100 V or 125 V: 15 A Travel Speeds: Creep speed, SLOW function: 0 to 5 mm/s Setup mode: 0 to 70 mm/s Automatic measurement: Axis (X, Y) max. 200 mm/s Axis (Z) max. 50 mm/s Cjdpfx Aezii Dhsiljgw Axis (3D) max. 287 mm/s Ambient Conditions: The following conditions must be met for proper operation of the measuring machine. Operating ambient temperature: +17°C to +35°C Relative humidity: 40% to 70% (non-condensing) Room temperature for measurement: 20°C ±1 K Altitude above sea level: 100–125 V: max. 3000 m 230–240 V: max. 2000 m Probe System: Probe System: CFS Probe Types Data: Probe Type: CFS 2 mm Measuring range: 2 mm, Working distance: 61 mm, Spot diameter: 12.5 µm Measurable surface angle to beam direction: 90 ± 15° Measuring range: 3 mm, Working distance: 22.5 mm, Spot diameter: 12 µm Measurable surface angle to beam direction: 90 ± 30° Measuring range: 10 mm, Working distance: 70 mm, Spot diameter: 24 µm Measurable surface angle to beam direction: 90 ± 20° The values for surface angles are limit values and depend on the reflectivity of the workpiece surface. Rotary Table: Mass and resolution Table weight: 7 kg Resolution: 0.15’’ Dynamics: Angular speed max: 50°/s Rotational speed: 8.3 min⁻¹ Scope of Delivery: In the standard version, the O-INSPECT coordinate measuring machine is supplied with the following components: - Coordinate measuring machine (CMM) - Controller (integrated) - Control panel - PC with peripherals - Software - CALYPSO 5.2 - Documentation - Probe system - Reference stylus - Calibration artifact - Calibration template Scope of delivery: (Zeiss coordinate measuring machine as shown) Condition: used (Specifications subject to change and errors excepted!) Please inquire about transport options prior to purchase. If you have further questions, we are happy to assist you by phone.

Condition: like new (used), Year of construction: 2015, functionality: fully functional, machine/vehicle number: 201502530269, measuring range X-axis: 700 mm, measuring range Y-axis: 700 mm, measuring range Z-axis: 600 mm, table load: 560 kg, Equipment: documentation/manual, type plate available, ZEISS CONTURA G2 7/7/6 – VAST XXT TL1 Year of Manufacture: 2015 | Commissioned: 2016 | Immaculate Condition | Extremely Low Operating Hours We are offering for sale a ZEISS Contura G2 coordinate measuring machine (CMM) with a measuring range of 700 × 700 × 600 mm, equipped with a VAST XXT TL1 scanning probe head. The device comes from a controlled laboratory environment and was used exclusively on-demand, single-shift operation, never on a production line – resulting in exceptionally low actual usage and outstanding technical condition. 🔹 Basic Information Cgedpoyzmbdefx Ailow Manufacturer: ZEISS Model: Contura G2 Measuring Range (X/Y/Z): 700 / 700 / 600 mm Year of Manufacture: 2015 Commissioned: 2016 Technical and Visual Condition: Perfect Measurement Error MPE (E0) = 1.7+L / 350 μm 🔹 Configuration and Accessories ✅ ZEISS VAST XXT TL1 active scanning probe head ✅ Stylus rack / magazine ✅ Set of measuring styli (mainly diameters ⌀ 0.6 mm and ⌀ 1.5 mm) ✅ Reference sphere ✅ BP26_SE control console 🔹 Usage History Device used exclusively in laboratory conditions Occasional, project-based (on-demand) use Single-shift operation, no serial or production work As a result, the machine exhibits extremely minimal mechanical wear 🔹 Service and Calibration ✅ Service and calibration exclusively by official ZEISS technicians ✅ Regular maintenance according to manufacturer guidelines ✅ No third-party interventions ✅ Device fully operational 🔹 Status 📍 Machine available immediately 🔍 Viewing possible 📄 Full documentation included ✅ Buyer arranges transport

Condition: used, Original ZEISS CMM Probe Holders and Stylus Extensions Original ZEISS probe holders Stylus extensions Various star styli and straight styli As shown in the pictures Condition: Used Good working condition Carefully removed from a functioning ZEISS CMM Ideal for ZEISS CMM users looking for original replacement or additional probing equipment. Csdpszg Eczefx Ailegw

Year of construction: 1990, condition: used, x-travel 850 mm y-travel 1200 mm z-travel 600 mm total power requirement kW weight of the machine ca. t dimensions of the machine ca. m Universal 3D measuring center, double-column, modern software, many accessories Cgjdst Hwqkspfx Ailjw

Year of construction: 1995, condition: used, x-travel 9200 mm y-travel 1600 mm z-travel 2400 mm dia. of test piece mm working area mm dist. between centers mm Cjdpst Hwwksfx Ailegw control ZEISS C 99 total power requirement kW weight of the machine ca. 30 t dimensions of the machine ca. 10 x 3,6 m

Condition: used, Year of construction: 2005, Large ZEISS PRO T SELECT Coordinate Measuring Machine (CMM) available for immediate sale. The machine was previously installed in a professional metrology laboratory and has been professionally decommissioned. It is stored indoors and is ready for shipment. Technical specifications: * Manufacturer: ZEISS * Model: PRO T SELECT * Year of manufacture: 2005 * Serial number: 131860 * Steel measuring table: 4000 × 3000 mm * Probe system: Renishaw RDS-CAA indexing probe head * Calibration according to DIN EN ISO 10360 * Latest ZEISS calibration performed in 2025 (documentation available) * Complete machine * Indoor storage * Ready for immediate loading and worldwide shipment Included: * Complete ZEISS PRO T measuring machine * Renishaw RDS-CAA probe head * ZEISS calibration documentation (2025) * Available technical documentation (upon request) Additional information: Cgsdpfx Aiszga D Hslsw The machine is available for inspection by appointment.

Condition: used, Feeler gauge Passimeter Cedpfoda Abaox Ailogw Manufacturer: Zeiss Jena 0-25 mm in a wooden box

Condition: ready for operation (used), Year of construction: 2003, functionality: fully functional, 3D Coordinate Measuring Machine | Brand: MAUSER/ZEISS | Type: KMZ-G 602520 | Year of manufacture: 1988/2003 Optionally available with an air-conditioned hall. The machine has been calibrated regularly by ZEISS. The last calibration was performed on August 7, 2025, the next calibration (recommended) is scheduled for August 2026. TECHNICAL SPECIFICATIONS:: Measuring ranges (Length x Width x Height): 6.000 x 2.500 x 2.000 mm Travels: - X-axis: 6.000 mm - Y-axis: 2.500 mm - Z-axis: 2.000 mm - Length measurement uncertainty according to VDI/VDE 2617: U3 = (5,0 + L/250)µm, V2 = 3,5 µm - Length measurement uncertainty according to ISO 10360-2: MPE_E = (5,0 + L/250)µm Cedey Iub Sepfx Ailegw - Environmental conditions for maintaining the specified accuracy: * Temperature range: 21°C +/- 3°K * Temperature fluctuation: 0,5°K/h, 1,0°K/d, 0,5°K/m - Environmental conditions for operation: * Temperature range: + 15°C up to 35°C * Humidity: 30 up to 70% General features, Equipment: - Portal measuring machine with ultra-precision guides and ball-screw drives - Second Y-axis with granite guideway and air bearing - High-resolution Zeiss scales - Positive-drive mechanisms in all three axes - Collision protection for the quill and probe head (for VAST-TK) for manual and setup modes - Safety position for crane interlock - Reference temperature compensation - Microcomputer control - Practice piece: cube, star-shaped stylus - Reference probe D = 8 mm, length: 115 mm - Reference standard D = 30 mm - includes basic software package - Load-bearing capacity: Limited only by the foundation design - Measuring system: VAST - Software: Zeiss CALYPSO - Documentation Without guarantee of completeness and correctness of the technical information and the equipment. - Subject to prior sale -

Condition: ready for operation (used), Zeiss 608093 9203 ÄZ02 35/05 Path measurement 32 Prismo / Wegmessung 32 Prismo-ST 608093-9203-701, used, as good as new condition, 100% functional Cgedoy T Dp Aopfx Ailow

Condition: excellent (used), Year of construction: 2018, measuring range X-axis: 500 mm, measuring range Y-axis: 500 mm, measuring range Z-axis: 500 mm, workpiece weight (max.): 100 kg, The system was hardly used (the order was cancelled). CMM DuraMax 5/5/5 ZEISS CNC coordinate measuring machine (CMM) with cantilever design. Cgsdpfezb U Hasx Ailsw Maximum permissible length measuring deviation (MPE) according to ISO 10360-2:2009: - MPE_E0 (3D) = (2.4 + L/300) µm for 18 - 22 °C - MPE_E0 (3D) = (2.7 + L/250) µm for 18 - 26 °C - MPE_E0 (3D) = (2.9 + L/200) µm for 18 - 30 °C Maximum permissible scanning probe deviation (MPE) according to ISO 10360-4:2000 within the maximum permissible scanning test duration (MPT). MPE_THP = 2.9 µm within MPT_tau = 55 s. Single probe deviation form according to ISO 10360-5:2010. MPE_PFTU = 2.4 µm. Form measuring deviation according to ISO 12181:2011 (VDI/VDE 2617 Part 2.2). MPE_RONt (MZCI) = 2.4 µm.

Condition: used, Year of construction: 2000, Zeiss Vista measuring machine, manufactured in 2000. Cgjdpfx Aszd Dkxjilsw