Used Fischerscope for sale (3)

Condition: good (used), Helmut Fischer Fischerscope X-ray fluorescence Coating thickness measurement XDL XDL-B XYmZ Pgodpfx Aksw Hbime Hjr

Condition: used, Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8 X-ray fluorescence coating thickness measuring device Manufacturer: Helmut Fischer GmbH + Co. KG, Germany Type: XDL-XYZpT8 Model: FISCHERSCOPE X-RAY Machine type: X-ray fluorescence measuring device / coating thickness measuring device (XRF / RFA) For sale is a used X-ray fluorescence measuring device from the manufacturer Helmut Fischer GmbH + Co. KG. The FISCHERSCOPE X-RAY is suitable for non-destructive coating thickness measurement and material analysis using X-ray fluorescence (XRF/RFA). The system is designed for measuring functional layers, corrosion protection layers, and various metallic coatings and is used in quality assurance, electroplating, surface technology, research, and laboratories. The device comes from a warehouse liquidation and is explicitly sold untested and without warranty. Technical data: Manufacturer: Helmut Fischer GmbH + Co. KG Model: FISCHERSCOPE X-RAY Type: XDL-XYZpT8 Serial number: SN010002436 Made in Germany CE marking present Measuring system: X-ray fluorescence (XRF / RFA) Measuring chamber with C-slit Standard X-ray tube Proportional counter Fixed aperture and fixed filter DCM stroke: 0–80 mm Supply voltage: 230 V AC Frequency: 50–60 Hz Power consumption: 120 W Equipment: Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8 Measuring chamber with protective cover Software Pgodpfx Akjzl Ulvo Hor Operating manual Power connection Serial interface (Sub-D) Other accessories as shown in the pictures Application areas: Coating thickness measurement Material analysis X-ray fluorescence analysis (XRF) Quality assurance Electroplating Surface technology Materials testing Laboratory Research and development Condition: Used. The device comes from a warehouse liquidation. Optical condition as shown in the pictures. The device has not been tested by us and is explicitly sold untested and without warranty. Scope of delivery: Helmut Fischer FISCHERSCOPE X-RAY XDL-XYZpT8 Software Operating manual Other accessories as shown in the pictures Scope of delivery as shown in the pictures. Subject to changes, errors and prior sale.

Condition: ready for operation (used), Year of construction: 2001, functionality: limited functionality, For sale is a Fischercope H100C XYp micro-/nano-hardness testing system by Helmut Fischer (year of manufacture: 2001). The device was last used in a laboratory, but is currently not fully functional and is therefore expressly sold as defective / for repair or as a source of spare parts. Known issues: - Table advance movement does not function correctly (the table is positioned under the measuring head, not under the microscope – precise measurement is currently not possible). Likely an electronic issue. - The measuring table moves independently to the left – possibly a joystick failure. - Indenter change does not work correctly (the probe does not move fully to the end stop). Therefore, the device is particularly suitable for: • Repair by individuals with electronics expertise • Sourcing of spare parts • Research / hobbyists Pedpfeyu Nabex Ak Hsgr The optical condition is good for its age.