Used Bruker Microflex for sale (4)

Condition: used, This listing is for the This listing is for the Bruker microflex mass spectrometer The unit is in full working condition and is ready for immediate use The Bruker Microflex is a Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer (MALDI-TOF MS), primarily used for rapid identification of microorganisms, biomolecules (like proteins and peptides), and polymers. It is part of Bruker’s MALDI Biotyper series Key Components: Laser Source: Nitrogen or solid-state laser (commonly 337 nm UV) Ion Source: Vacuum chamber with MALDI target plate Flight Tube: Measures time-of-flight of ions Detector: Converts ion arrival times into a mass spectrum MALDI Target Plate: Metal plate for spotting samples mixed with matrix How It Works (Simplified): Sample Prep: Mix analyte with a MALDI matrix (e.g., α-cyano-4-hydroxycinnamic acid). Laser Ionization: Laser hits the matrix, causing it to ionize the sample. Ion Acceleration: Ions accelerated into TOF analyzer. Detection: Time-of-flight is measured; smaller ions reach the detector faster. Spectrum: Mass/charge ratio (m/z) plotted vs intensity. Physical Specs (Approximate): Footprint: Desktop size (about 80 cm width) Dsdpfx Aoxhdxqjb Tskp Weight: ~100–120 kg (varies by model/version) Power: Standard lab electrical supply Environment: Requires clean, stable temp/humidity condition

Condition: used, Bruker Type: Tensor 27 IR Spectrometer Maximum sample flexibility. Thanks to the improved QuickLock™ mechanism and the locking button on the front, even bulky accessories can be installed quickly and, above all, safely. In addition, the INVENIO can be equipped with three software-controlled beam outputs for a wide range of external modules. FPA micro and macro imaging Variable external sample chamber (left and right) for individual experiments Fiber optic coupling to fiber probes for liquids and solids Integrating sphere Autosampler for liquids High-throughput analysis module HTS-XT Reflection unit for the air-water interface And much more! Condition: used Scope of delivery: (See picture) (Changes and errors in the technical data and specifications are subject to change!) We will gladly answer any further questions you may have over the phone. Dsdpszh D Nvsfx Ab Tekp

Condition: used, Removed from working unit. Please check out our other listings as well. Dkodpfx Aowxax Deb Tep

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: Dkedpfjzd Ufasx Ab Tep X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)