Used Vickers Instruments Vickers Instruments Binocular Microscope for sale (1,504)

Condition: defective spare-parts repository (used), Vickers Type: HVS 1000 The digital micro-Vickers hardness tester HVS 1000 features a unique and precise design in the areas of mechanics, optics, and light source, and is capable of producing a clearer image of the impression, thus enabling more accurate measurements. Main purpose and scope of application: 1. Iron and steel, non-ferrous metals, metal foils, hard alloys, sheet metal, microstructures 2. Carburized, nitrided, and decarburized layers, surface hardening layers, plating, coatings 3. Glass, wafers, ceramic materials Specifications: Model HVS1000 Type Digital Micro Hardness Tester Test forces (N) 0.098 / 0.246 / 0.49 / 0.98 / 1.96 / 2.94 / 4.90 / 9.80 Test forces (Kgf) 10 / 25 / 50 / 100 / 200 / 300 / 500 / 1000 Load control Automatic loading and unloading Objective-indenter turret Manual Dwell time (s) 0~60 Microscope magnification x 400x for measurement, objective 40x, eyepiece 10x Redpfxezgbr Ss Aahew 100x for observation, objective 10x, eyepiece 10x Micrometer resolution (μm) 0.01 Test range 5 HV~3000 HV Dimensions of XY test table 100X100 mm Travel range of XY test table 25X25 mm Max. sample height 120mm Max. sample width 110mm Hardness conversion HK, HRA, HRB, HRC, HRD, HR15N, HR30N, HR45N, R15T, HR30T, HR45T, HV, HBW Output Built-in printer, RS232 interface Power 220V, 60/50Hz Dimensions (mm) 441 x 270 x 480 Net weight / kg) 35 Condition: used Scope of delivery: (See picture) (Subject to changes and errors in technical data and information!) We will be happy to answer any further questions you may have by phone.

Condition: new, VHX-600E, Keyence Digital Microscope - New Model: VHX-600E Type: VHX-600E Rsdpoq S Ti Esfx Aahsw Condition: New

Condition: excellent (used), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive, graphical user interface (GUI) running on Microsoft Windows XP Professional. Instrument configuration includes the following features: • Magnification range: 5x – 300,000x • Acceleration voltage: 0.3 – 30 kV • Tungsten filament cathode (LaB6 cathode optional) • Large fully motorized sample stage with eccentric tilt capability, including: – Graphic navigation on the sample holder – Easy sample navigation via click-center-zoom – Field-of-view controlled navigation via two navigators – Relative coordinate navigation – Save and recall of sample positions – Adjustable stage field-of-view selection • Field-of-view correction during rotation via computer-driven eccentric rotation • Field-of-view correction during tilting via computer-driven eccentric tilting • Calculation of the possible tilt angle based on sample geometry • Automatic focus tracking when moving the sample in the Z-axis • Intelligent limit switches for all motorized axes • Stage travel: X = 125 mm Y = 100 mm Z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) • Secondary electron detector for high vacuum operation • Newly designed, super-conical objective lens for optimal resolution at high tilt angles • Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV • Simultaneous live imaging with multiple detectors • Powerful image measurement functions • Movie function for recording dynamic processes • Versatile specimen chamber with numerous expansion options: free ports for EDX, WDX, EBSD, cathodoluminescence, etc. • Low-maintenance, quiet pump system consisting of a fore vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control • Comprehensive safety procedures against misuse and external media failure • Ergonomic, height-adjustable system table • SEM starter kit including 2 sample holders, tool kit, and 6 replacement filaments Additional equipment for SEM: • Turbomolecular pump (instead of standard diffusion pump) – Use of a turbomolecular pump eliminates the need for cooling water during SEM operation. Further SEM equipment: • PC for SEM control including TFT monitor Rjdpfx Aaszd Ufaohow • ΟΧ200 Bruker Quantax 200 Extended EDX System – Bruker EDX software will be transferred to new owner upon purchase • Nitrogen-free, energy-dispersive X-ray analysis system including: – SDD detector with 127 eV energy resolution or better – Detection for all elements from boron upwards – Vibration-free, maintenance-free. Peltier cooled (no nitrogen required) – Pulse processor – TFT monitor – Spectrum measurement and element identification – Fully automatic, quantitative, standardless elemental analysis – Image acquisition – Ultra-fast qualitative line scan – Ultra-fast qualitative element mapping – Data management and archiving system – Report generation and results output – Data communication – Installation and user training – HyperMap – Multipoint analysis – Bruker xFlash detector (SDD) with signal processing unit SVE III Scope of delivery: (see photos) Condition: used (Subject to changes and errors in the technical data and specifications!)

Condition: excellent (used), TAMAR Type: FEMET_WI_ID071_TAMAR PLMIS Optical Microscope Optical Microscope The TAMAR optical microscope ID071 is used for the optical inspection of samples with a maximum size of approximately 780x650mm2 (substrate size) in the PLG cleanroom. Substrate size: complete substrate size (780x650mm2) Objective: The objective lens focuses the light emanating from the object being observed to create a real image for the viewer. Brightfield mode (BF): Light from the microscope is directed through the objective lens onto the sample. High resolution, low contrast Rsdjzd Sqmspfx Aahjw Darkfield mode (DF): Illumination mode for increasing contrast, high contrast for edges and particles. Principle: The center of the incident light beam is blocked, and only peripheral light is directed through the objective lens and strikes the sample from the side. This causes edges and particles to appear bright, while the smooth background appears dark. TAMAR Optical Microscope ID071 X-Y Stage Software Revision 1.0 Condition: used Scope of supply: (autosampler as shown in the picture) (Changes and errors in the technical data are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: not inspected (used), 1 item: Measuring devices, manufacturer: Gossen, type: Metrawatt, Metratester 4, Profitest 204, Secutest S2. Rjdpfx Aaezg D Txjhsw

Condition: excellent (used), Shimadzu Type: Prestige-21 / with AIM-8800 Infrared Microscope Shimadzu IR Prestige-21 Infrared Spectrophotometer The IRPrestige-21 is designed for both highly sensitive and broad applications in the fields of research and development. It is an excellent addition to the existing FTIR series, which covers, among other things, the standard laboratory area. AIM-8800 Specifications Optics: 15x Cassegrain objective lens 15x Cassegrain condenser mirror with inlet for purging MCT detector: Rsdpfezdyyiox Aahjw with liquid nitrogen monitoring system Wavelength range: Type 1 - 5000 - 720 cm-1 Type 2 - 5000 - 650 cm-1 Electrically activated aperture XY Θ directional drive. Adjustment of the XY directional increments is 1 µm above the sample surface and 1° steps in the Θ direction (numerical input possible). Minimum adjustment value: 3µm Motor-driven XY sample stage Positioning range: X-axis: 70 mm; Y-axis: 30 mm Resolution: 1 µm spacing Sample thickness: Reflection mode - ≤ 40 mm Transmission mode - ≤ 10 mm Operation via the main unit's keyboard Selection of the measurement mode / XY stage operation (speed control in 4 steps) / manual focusing / illumination control (Optional) Control via PC Selection of the measurement mode / XY stage operation / automatic centering / manual focusing / automatic focusing / illumination control / Aperture adjustment / aperture preview / measurement position and recording of the aperture setting (10 sample positions, 2 background positions) Environmental conditions: Ambient temperature: 15°C ~ 30°C Humidity: 70% or less External dimensions, weight: W410mm x D540 mm x H520 mm x 36kg Condition: used Scope of supply: (See image) (Changes and errors in the technical data and information are subject to change!) We will be happy to answer any further questions you may have by telephone.

Condition: used, TECHNICAL DETAILS - Magnification : 6,4-10-16-40 - W 10/23 Redpfsug U Rtsx Aahsw

Condition: used, TECHNICAL DETAILS Rodpjug U Rmofx Aahsw - Magnification : W 10 x 21 B

Condition: used, TECHNICAL DETAILS Redpeug U Rgsfx Aahow - Objectives : 1.5X et 0.5X - Light : OLYMPUS HIGHLIGHT 3001

Year of construction: 2005, condition: used, functionality: unexamined, machine/vehicle number: X-1802, Used Andor Ixon DV885JCS-VP microscope camera in a case. Manufacturer: Andor Technology Model: (Ixon) DV885JCS-VP Redezgtnfopfx Aahsw Includes software, power supply, connection cables, and system PCBs.

Condition: used, functionality: unexamined, machine/vehicle number: SX-50, Used Cameca SX-50 Electron Microprobe Cameca SX-50 electron microprobe is used (Electron Probe MicroAlalyses). it has a 6” inch stage, 3 WDX Spectrometers with several Cristals LiF, PET, TAP, ODPb, PC1, PC2, PC3. Electron probe microanalysis (EPMA) are generally considered micro-analytical techniques which are able to image or analyze materials we can not generally observe with the resolution offered by visible techniques System is complete with all Books, service Manuals, Software and computer. Also many parts. Rjdpswnb D Tefx Aahsw 1 x Leybold Trivac D16B Vacuum Pump 1 x Alcatel 2012 A Vacuum Pump 2 x integrated Turbo Pumps

Condition: excellent (used), ZEISS Type: DSM 962 The digitized scanning electron microscope DSM 962 is a device equipped with an integrated 4 MB image memory, a 40 MB hard drive for internal image storage, as well as drives for external storage of data and images. This allows for quick and easy acquisition of information about the composition and morphology of specimen surfaces, even down to the sub-micrometer range. With a magnification range of 5x to 300,000x, both the examination of macrostructures and microstructures is possible. Through special attachments, the range of applications can be significantly expanded, enabling, for example, analytical investigations in micro-areas of the surface. The device can be operated using conventional switches or via the keyboard and mouse (optional). The electron optics and vacuum control are conventional. The functions of the image memory are operated using the keyboard or mouse (optional). A separate information display is located centrally on the control panel for displaying the menus. This user manual is intended to serve as a guide for the user to achieve the best possible results with the device. The explanations have been kept as simple as possible in order to provide even a less experienced user with the necessary knowledge. Magnification range: 20x to 300,000x at a 7 mm working distance Steps in a sequence of 1-2-3-5-10 Minimum magnification: 5x at a 50 mm working distance Resolution: 4 nm - guaranteed with tungsten filament at 30 kV, 6 mm working distance, untilted specimen 25 nm - guaranteed with tungsten filament at 1 kV, 6 mm working distance, untilted specimen 3.5 nm - guaranteed with optimized LaB6 filament at 30 kV, 6 mm working distance, untilted specimen Redpfxjzdthys Aahew Scope of supply: (DSM 962 with accessories as shown) Condition: used (Changes and errors in the technical data are subject to change!) Please inquire about transport options before purchasing. We will be happy to answer any further questions you may have by phone.

Condition: good (used), Here, we offer a handling device from ZASCHESitec. This device was used in the manufacturing of instrument panels. It consists of the following components: KBK - FPM 10 - 7.0 x 5.0 Traveling carriage - LWK 762 x 762 Lifting module - Z-L6 - 80/1280 - 1486 Load handling device - GP10 Load capacity: 10 kg Scope of delivery: (ZASCHESitec handling device, technical documentation) Condition: used Redozdim Hopfx Aahew We would be happy to answer any further questions you may have over the phone. Written orders can be placed via email or fax.

Year of construction: 2014, condition: new, digital length measuring device, manufacturer: Heidenhain, ID 355 533-04 Measuring scale, type LF 481 – Signal 1Vss – Measuring length 200mm. Rodpfxeb T Uqij Aahew

Condition: used, Tool measuring device Manufacturer: Mitutoyo Type: Quickset R Rjdpeddtuyofx Aahew

Condition: excellent (used), Microscope Magnifying glass Manufacturer: Hartmann Type: Accu Lux 20x magnification in a wooden box with operating instructions Redpfx Aod Iacweahow

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04078-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Redox Eugispfx Aahjw

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 04078-T, used, in good condition, 100% functional, scope of delivery as shown in photos. Redpfox Eug Aex Aahjw

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser transmission line sensor 29/16 03819-R, used, in good condition, 100% functional, scope of delivery as shown in the photos. Redpfox Eugcjx Aahsw

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-R-CL laser through-beam line sensor 47/16 04079-R, used, in good condition, fully functional, scope of delivery as per photos. Rodpfxsx Eugpo Aahjw

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL laser through-beam line sensor 47/16 04077-T, used, in good condition, 100% functional, delivery as per photos. Rsdpfxsx Eugvs Aahsw

Condition: ready for operation (used), Sensor Instruments L-LAS-TB-16x1-T-CL Laser Through-Beam Line Sensor 47/16 04079-T, used, in good condition, 100% fully functional, delivery as per photos. Rodpfox Eug Nsx Aahsw

Condition: new, Year of construction: 2026, functionality: fully functional, warranty duration: 12 months, input voltage: 230 V, measuring range X-axis: 200 mm, measuring range Y-axis: 85 mm, measuring range Z-axis: 50 mm, total width: 483 mm, total length: 598 mm, total height: 464 mm, overall weight: 64 kg, input current: 5 A, repeat accuracy: 0.005 mm, input frequency: 50 Hz, Equipment: CE marking, USB port, documentation/manual, type plate available, PG1000-400 – Optical system for inspecting the geometry of rotating cutting tools PG1000-400 is a professional optical measuring and inspection system for quickly checking the geometry of cutting tools. It is designed for tool manufacturers, sharpening shops, grinding shops, tool rooms, CNC machining centers, and quality control/metrology departments. Its main application is the inspection of rotating cutting tools after manufacturing, grinding, sharpening, or reconditioning. The system is suitable for HSS and solid carbide tools, especially drills, end mills, step drills, reamers, taps, form tools, micro tools, and custom-made tools. The device can also be used to inspect carbide inserts, selected thread geometries, screws/bolts, and other precision parts, provided that the geometry being inspected is optically accessible to the camera. The system's primary focus is on the inspection of cutting tool geometry. Typical applications: Rodpfxszdz S Tj Aahew - In-process inspection directly at the grinding machine or in production - Incoming and outgoing inspection of tools - Inspection after sharpening/regrinding - Quality documentation and measurement reports - Repeated inspection of serially produced tools PG1000-400 allows for the inspection of, for example: - Rake angle and clearance angle - Helix angle - Point angle for drills - Radii and corner radii - Diameters and distances - Cutting edge length - Land width, margin width, facets - Web thickness - Tool profile - Runout - Condition and wear of the cutting edge - Comparison of geometry with DXF/DWG drawings The system operates optically and non-contact. This is advantageous when inspecting sharp edges, fine microgeometries, coated tools, and precise edges, where speed, repeatability, and minimizing operator influence are important. The system includes REACTION software, developed specifically for the inspection of cutting tools. The software offers more than 50 measuring functions, edge detection, automatic alignment of measuring points to the edge, saving inspection scenes, comparison with DXF/DWG geometry, PDF reports with PASS/FAIL evaluation, and data export to Excel/CSV. Technical specifications: - Recommended tool diameter: 0.635–75 mm - Tool measuring length: approx. 190–200 mm - Magnification range: 12.5× to 145× - Camera: 5 MP - Monitor: 27" 4K Ultra HD - Measuring range: 85 mm vertically × 200 mm horizontally - Accuracy/repeatability: ±5 µm at maximum magnification - Device dimensions: approx. 598 × 483 × 464 mm - Weight: approx. 64 kg Offered configuration: - PG1000-400 optical cutting tool inspection system - M / F / A encoders - PC with REACTION software - 27" 4K Ultra HD monitor - Flexible LED lighting with diffuser - Curved magnetic diffusion plate - Rotating base block for clamping fixtures - 1000-026-5"-ASS – 5" V-block assembly with insert, top clamp, and stop - Basic remote operator training About the manufacturer: PG1000 is based on the long-term development of systems for inspecting cutting tools. The first generation of PG1000 was introduced in 1993. The system is manufactured in the USA by PG Inspection Technologies LLC, which specializes in this product line. Since 1996, more than 1000 PG1000 systems have been delivered. Condition and delivery: - New machine - Year of manufacture: 2026 - Warranty: 12 months - Location: Czech Republic / EU - Delivery, assistance with commissioning, and training according to agreement - CE marking and relevant EU documentation The device i

Condition: ready for operation (used), X-axis: 300mm, y-axis: 200mm, z-axis: 200mm, working distance: 77mm, max. workpiece height: 200mm, max. workpiece weight: 20kg, length: 730mm, width: 900mm, height: 950mm, weight: 125kg, optical length measurement error (2D): 2.9 + L/100µm (L in mm) at 20°C ±1K, tactile length measurement error (MM2/TP20): 4 + L/75µm (L in mm), optical lens: 1.5x, screen magnification: 47-80x, field of view: 4.5x3.5mm, camera: 1.3 megapixel CMOS with autofocus. Equipment: 3-axis CNC control via servo drives and joystick, IK 5000 measuring software, IK 5000 measuring computer for 2D and 3D geometric measurements, integrated CAD module for DXF and IGES data, automatic fit routine for comparison of freeform contours, scaling routine, tolerance inspection according to DIN ISO 1101, data export to Microsoft Office or to databases/SPC/QS systems via ODBC interface, report generator for user-defined measuring tasks, storage of executed actions as measuring macros. An on-site inspection is possible. Rodpjzc Rdwjfx Aahjw

Condition: repair required (used), Renishaw InVia Raman Microscope Spectrometer Complete with MSC20 Encoded Stage Controller RL532C50 HPNIR Laser Source A-9803-0625 CCD 1. The device doesn't come with a software license or computer. We are selling the device as it is. Rjdpfxsym Dt Hj Aahsw 2. There is a HPNIR785 Renishaw Laser Source installed on the device. Unfortunately we are a surplus seller and do not possess the expertise to test and run this machine for diagnostics. Our intentions are to sell the device for parts and leave a buyer recondition to their required standards. Device is missing some parts to make fully operational. Device is missing Renishaw Ramen Filters as seen in images. Device also is missing original Renishaw Key to open access panel.